Electron. J. Math. Phys. Sci., 2002, Sem. 1, 16-24

 

Bayesian Economic Cost Plans III. The Lot Mean Relative to a Quality Characteristic

Abraham F. Jalbout 1$*, Hadi Y. Alkahby 2, Fouad N. Jalbout 3 , Abdulla Darwish 3

1Department of Chemistry, University of New Orleans, New Orleans, LA 70148-2820 USA, E-mail: Ajalbout@ejmaps.org

2Department of Mathematics, Dillard University, New Orleans, LA 70112 USA

3Department of Physics and Engineering, Dillard University, New Orleans, LA 70112 USA

*Author to whom correspondence should be addressed. $Guest Speaker at the Dillard University Seminar Series October 29, 2001

Received: 14 November 2001 / Accepted: 5 January 2002/ 15 January 2002

 

 

Abstract: A quality control manufacturing process is designed to produce certain types of components (i.e. mechanical, electrical or chemical). The process is defined to be under control if the fraction of the items manufactured that are defective is reasonably small. The fraction of items defective varies from lot to lot, which is the main assumption that we will use in the mathematical development of our reliability model. It is logical to assume in this case that the mean of the lot is a random variable and so is the fraction defective. A relationship between the two quantities is the subject of this paper. 

Keywords: fraction defective, industrial process, Bayesian methods, statistics,

AMS Mathematical Subject Classification: 46N30, 62-06,62P30

 

 

Document Summary:

 

History

Received: 14 November 2001 / Accepted: 5 January 2002/ 15 January 2002

Subject

Quality control, engineering

AMS

Codes
  • CODE: 46N30
    Miscellaneous applications of functional analysis: Applications in probability theory and statistics
  • CODE: 62P30
    Applications: Applications in engineering and industry
  • YEAR: 2002

Keywords

Bayesian analysis, cost model, comparison, lot size, fraction defective

Doc type

Lecture series, seminar edition of EJMAPS

Edition

Electronic Journal of Mathematical and Physical Sciences Conference/Seminar Edition [ISSN: 1538-3318]

 

© 2002 by EJMAPS (http://www.ejmaps.org). Reproduction for noncommercial purposes permitted