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Main research topics: |
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- Investigation, characterisation, and refinement of crystal structures: single-crystal and powder X-ray diffraction investigation of minerals, and synthetic inorganic and organic materials also under extreme conditions including synthesis, Rietveld refinements, neutron diffraction, and thermal studies, determination of new minerals
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- Mineral resources: deposits of ores and industrial minerals (formation, general mineralogy, inclusions)
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- Applied mineralogy and materials science research: focus on microporous materials such as zeolites, mullite-precursors (crystal chemistry, physical properties, synthesis)
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- Applied mineralogy and materials science research: focus on gems and gem materials: identification, charcterisation, treatment, imitations
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- Trace hydrogen and hydrous species in nominally anhydrous minerals (NAMs) and hydrogen bonding in inorganic materials: spectroscopic (mainly IR absorption) studies
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- Radiation effects in natural minerals, incl. alteration as induced by artificial irradiation (structural, chemical, spectroscopic, and isotopic characterisation and mathematical modelling)
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- History of earth sciences
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| Equipment: |
Supervisor: |
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Nonius Kappa single-crystal X-ray diffractometer with a CCD area detector and heating/cooling stage (80 to 700 K). |
Giester |
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KAPPA APEX II CCD X-Ray diffractometer of the manufacturer Bruker AXS with image plate CCD. |
Giester |
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Conventional Stoe AED2 single-crystal X-ray diffractometer with closed Eulerian cradle and scintillation counter. |
Effenberger |
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STOE StadiVari four-circle goniometer with open Eulerian cradle and Dectris PILATUS 300K pixel detector. |
Effenberger
Miletich-Pawliczek |
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Huber 5042 four-circle diffractometer with a point detector for in-situ XRD. |
Miletich-Pawliczek |
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FEI Inspect S, with back scattering elctrons detector and energy dispersive X-ray device, measurements in vacuum and high vacuum |
Libowitzky |
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No picture
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A JEOL scanning electron microscope equipped with an EDX unit for elemental analysis. |
Götzinger,
Libowitzky |
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Philips X'Pert powder X-ray diffractometer, theta-2theta type with scintillation counter and 21 position sample changer. |
Lengauer |
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Philips X'Pert MPD powder X-ray diffractometer, theta-theta type with proportional counter or position sensitive Raytech detector, attachments for capillary measurements (298 – 773 K) or a Paar TTK450 low-temperature chamber (93 – 723 K). |
Lengauer |
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Bruker D8-Advance powder X-ray diffractometer, theta-theta type with scintillation counter, energy-dirpersive Sol-X or position sensitive LynxEye detector and 105 position sample changer, attachments for a Paar XRK900 reaction chamber (298 - 1173 K). |
Lengauer |
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X-ray film equipment: Buerger precession-goniometer, Weissenberg-goniometer, HUBER 600 Guinier system with heating device (298 - 1173 K), Debye-Scherrer and Gandolfi cameras. |
Effenberger,
Lengauer |
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Bruker Tracer IV SD handheld XRF analyzer with 10mm2 X-Flash silicon drift detector. |
Giester |
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Mettler SDTA851e for thermal analysis (298 – 1373 K) with 34 position sample changer, a mass spectrometer (MS) for gas analysis and automatic gas control unit (air / N2). |
Lengauer |
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Mettler DSC821e for thermal analysis with LN2 cooling unit (123 - 973 K). |
Lengauer |
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Mettler TG50 for thermogravimetry (298 - 1173 K). |
Lengauer |
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DuPont moisture evolution analyzer 903H for quantitative water determination (298 bis 1273 K). |
Libowitzky |
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Horiba Fluorolog-3 spectrofluorometer (FL3-22 configuration) for obtaining excitation and emission spectra. Fibre-coupled to an Olympus BX-series microscope, for analyses with high lateral resolution. |
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Zeiss A1 Imager microscope with a J&M microspectrometer (190 – 980 nm). |
Libowitzky,
Lengauer |
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Horiba Jobin Yvon LabRAM-HR Evolution spectrometer,
dispersive spectrometer with 473/532/633 nm laser excitation, z-focus und software-controlled x-y sample stage for
Raman and photoluminescence line scans und maps. |
Nasdala |
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Horiba Jobin Yvon LabRAM-HR 800 spectrometer,
dispersive spectrometer with 532/633/785
nm laser excitation for high-resolution Raman and photoluminescence (PL) point analyses.
For excitation of PL (detectable in the range 400-1000 nm), there is also a 325 nm laser
along (with the fluorite objective needed) available. |
Nasdala |
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Renishaw RM1000 micro-Raman spectrometer with 488/514/632/782nm laser excitation for Raman spectroscopy, external 325 nm
laser excitation for UV-induced photoluminescence, and heating/cooling stage (80 bis
870 K).
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Libowitzky |
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A Bruker IFS66v/S FT-vacuum spectrometer with IRscopeII mirror-optics microscope, various light sources, beam splitters and detectors (50000 to 50 cm-1) with heating/cooling stage (80 bis 870 K). |
Wildner,
Libowitzky |
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A Bruker Tensor 27 infrared spectrometer with Hyperion microscope. |
Libowitzky, Nasdala |
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MBraun inert gas glove-box system with gas treatment and micro control system |
Lengauer |
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4 syntheses laboratories eg. for zeolites synthesis. |
Effenberger,
Lengauer |
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A mineral reference collection. |
Nasdala,
Giester |
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EDV: desktop PCs, an HP DesignJet large format printer. |
Wildner,
Rosen, Lengauer, Zirbs |
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Safety regulations |
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Assignments (Department of Mineralogy and Crystallography, German only): 
Room supervisors (Department of Mineralogy and Crystallography, German only):
Instrument operators (Department of Mineralogy and Crystallography, German only):
Pick-up points in case of emergency (Department of Mineralogy and Crystallography):
General laboratory and workshop instructions (Department of Mineralogy and Crystallography, English version):
Radiation protection (Department of Mineralogy and Crystallography, English version):
Laser protection (Department of Mineralogy and Crystallography, English version):
Allgemeine Labor- und Werkstättenordnung of the University of Vienna (German version):
Anhänge der Allgemeinen Labor- und Werkstättenordnung of the University of Vienna (German version):
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