|
|
|
|
|
|
 |
Main research topics: |
|
- Investigation, characterisation, and refinement of crystal structures: single-crystal and powder X-ray diffraction investigation of minerals, and synthetic inorganic and organic materials also under extreme conditions including synthesis, Rietveld refinements, neutron diffraction, and thermal studies, determination of new minerals
|
|
- Mineral resources: deposits of ores and industrial minerals (formation, general mineralogy, inclusions)
|
|
- Applied mineralogy and materials science research: focus on microporous materials such as zeolites, mullite-precursors (crystal chemistry, physical properties, synthesis)
|
|
- Applied mineralogy and materials science research: focus on gems and gem materials: identification, charcterisation, treatment, imitations
|
|
- Trace hydrogen and hydrous species in nominally anhydrous minerals (NAMs) and hydrogen bonding in inorganic materials: spectroscopic (mainly IR absorption) studies
|
|
- Radiation effects in natural minerals, incl. alteration as induced by artificial irradiation (structural, chemical, spectroscopic, and isotopic characterisation and mathematical modelling)
|
|
- History of earth sciences
|
|
|
|
Equipment: |
Supervisor: |
|
Nonius Kappa single-crystal X-ray diffractometer with a CCD area detector and heating/cooling stage (80 to 700 K). |
Giester |
|
KAPPA APEX II CCD X-Ray diffractometer of the manufacturer Bruker AXS with image plate CCD. |
Giester |
|
Conventional Stoe AED2 single-crystal X-ray diffractometer with closed Eulerian cradle and scintillation counter. |
Effenberger |
|
STOE StadiVari four-circle goniometer with open Eulerian cradle and Dectris PILATUS 300K pixel detector. |
Effenberger
Miletich-Pawliczek |
|
Huber 5042 four-circle diffractometer with a point detector for in-situ XRD. |
Miletich-Pawliczek |
|
FEI Inspect S, with back scattering elctrons detector and energy dispersive X-ray device, measurements in vacuum and high vacuum |
Libowitzky |
No picture
|
A JEOL scanning electron microscope equipped with an EDX unit for elemental analysis. |
Götzinger,
Libowitzky |
|
Philips X'Pert powder X-ray diffractometer, theta-2theta type with scintillation counter and 21 position sample changer. |
Lengauer |
|
Philips X'Pert MPD powder X-ray diffractometer, theta-theta type with proportional counter or position sensitive Raytech detector, attachments for capillary measurements (298 – 773 K) or a Paar TTK450 low-temperature chamber (93 – 723 K). |
Lengauer |
|
Bruker D8-Advance powder X-ray diffractometer, theta-theta type with scintillation counter, energy-dirpersive Sol-X or position sensitive LynxEye detector and 105 position sample changer, attachments for a Paar XRK900 reaction chamber (298 - 1173 K). |
Lengauer |
|
X-ray film equipment: Buerger precession-goniometer, Weissenberg-goniometer, HUBER 600 Guinier system with heating device (298 - 1173 K), Debye-Scherrer and Gandolfi cameras. |
Effenberger,
Lengauer |
|
Bruker Tracer IV SD handheld XRF analyzer with 10mm2 X-Flash silicon drift detector. |
Giester |
|
Mettler SDTA851e for thermal analysis (298 – 1373 K) with 34 position sample changer, a mass spectrometer (MS) for gas analysis and automatic gas control unit (air / N2). |
Lengauer |
|
Mettler DSC821e for thermal analysis with LN2 cooling unit (123 - 973 K). |
Lengauer |
|
Mettler TG50 for thermogravimetry (298 - 1173 K). |
Lengauer |
|
DuPont moisture evolution analyzer 903H for quantitative water determination (298 bis 1273 K). |
Libowitzky |
 |
Horiba Fluorolog-3 spectrofluorometer (FL3-22 configuration) for obtaining excitation and emission spectra. Fibre-coupled to an Olympus BX-series microscope, for analyses with high lateral resolution. |
|
|
Zeiss A1 Imager microscope with a J&M microspectrometer (190 – 980 nm). |
Libowitzky,
Lengauer |
|
Horiba Jobin Yvon LabRAM-HR Evolution spectrometer,
dispersive spectrometer with 473/532/633 nm laser excitation, z-focus und software-controlled x-y sample stage for
Raman and photoluminescence line scans und maps. |
Nasdala |
|
Horiba Jobin Yvon LabRAM-HR 800 spectrometer,
dispersive spectrometer with 532/633/785
nm laser excitation for high-resolution Raman and photoluminescence (PL) point analyses.
For excitation of PL (detectable in the range 400-1000 nm), there is also a 325 nm laser
along (with the fluorite objective needed) available. |
Nasdala |
|
Renishaw RM1000 micro-Raman spectrometer with 488/514/632/782nm laser excitation for Raman spectroscopy, external 325 nm
laser excitation for UV-induced photoluminescence, and heating/cooling stage (80 bis
870 K).
|
Libowitzky |
|
A Bruker IFS66v/S FT-vacuum spectrometer with IRscopeII mirror-optics microscope, various light sources, beam splitters and detectors (50000 to 50 cm-1) with heating/cooling stage (80 bis 870 K). |
Wildner,
Libowitzky |
|
A Bruker Tensor 27 infrared spectrometer with Hyperion microscope. |
Libowitzky, Nasdala |
|
MBraun inert gas glove-box system with gas treatment and micro control system |
Lengauer |
|
4 syntheses laboratories eg. for zeolites synthesis. |
Effenberger,
Lengauer |
|
A mineral reference collection. |
Nasdala,
Giester |
|
EDV: desktop PCs, an HP DesignJet large format printer. |
Wildner,
Rosen, Lengauer, Zirbs |
|
|
|
|
|
|
Safety regulations |
|
Assignments (Department of Mineralogy and Crystallography, German only):
Room supervisors (Department of Mineralogy and Crystallography, German only): 
Instrument operators (Department of Mineralogy and Crystallography, German only): 
Pick-up points in case of emergency (Department of Mineralogy and Crystallography): 
General laboratory and workshop instructions (Department of Mineralogy and Crystallography, English version): 
Radiation protection (Department of Mineralogy and Crystallography, English version): 
Laser protection (Department of Mineralogy and Crystallography, English version): 
Allgemeine Labor- und Werkstättenordnung of the University of Vienna (German version): 
Anhänge der Allgemeinen Labor- und Werkstättenordnung of the University of Vienna (German version): 
|
|
|
|
|
|
|
|